Machine Learning on Edge in Sensor Systems (SenSys-ML 2024)

Poonam Yadav*, Edith C.H. Ngai, Manik Gupta, Shaswot Shresthamali, Alok Ranjan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The explosion of sensors in smartphones and the Internet of Things (IoT) is generating a massive amount of data. This has the potential to revolutionise fields like healthcare, environmental management, and city planning. However, to unlock this potential, we need machine learning (ML) to transform raw sensor data into actionable insights. Machine learning offers a powerful way to turn sensor data into something we can understand and use. However, several challenges stand in the way of bringing these ideas to life: (1) Limited Resources: Devices often have limited computing power, memory, and battery life. (2) Complex Systems: Building ML models for sensor systems can be intricate. (3) Real-World Testing: Designing effective studies and collecting reliable data (ground truth) can be difficult. Sensys-ML 2024 workshop tackles these challenges by providing early feedback on research involving machine learning for sensor systems (TinyML). This workshop focuses on approaches that combine sensor data with ML, especially those that run on devices themselves or leverage edge/fog computing.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE 3rd Workshop on Machine Learning on Edge in Sensor Systems, SenSys-ML 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-2
Number of pages2
ISBN (Electronic)9798350363364
DOIs
Publication statusPublished - 24 Jun 2024
Event3rd IEEE Workshop on Machine Learning on Edge in Sensor Systems, SenSys-ML 2024 - Hong Kong, China
Duration: 13 May 202416 May 2024

Publication series

NameProceedings - 2024 IEEE 3rd Workshop on Machine Learning on Edge in Sensor Systems, SenSys-ML 2024

Conference

Conference3rd IEEE Workshop on Machine Learning on Edge in Sensor Systems, SenSys-ML 2024
Country/TerritoryChina
CityHong Kong
Period13/05/2416/05/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • Machine Learning
  • Sensor Systems
  • TinyML
  • UltraML

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