Magnetic and structural depth profiles of Heusler alloy Co2FeAl0.5Si0.5 epitaxial films on Si(111)

Stephanie Elizabeth Glover; Thomas Saerbeck; Balati Kuerbanjiang; Arsham Ghasemi; Despoina Kepaptsoglou; Quentin Ramasse; Shinya Yamada; Kohei Hamaya; Thomas P A Hase; Vlado Lazarov; Gavin R. Bell

doi:10.1088/1361-648X/aaa4c8

Magnetic and structural depth profiles of Heusler alloy Co₂FeAl_0.5Si_0.5 epitaxial films on Si(111)

Stephanie Elizabeth Glover, Thomas Saerbeck, Balati Kuerbanjiang, Arsham Ghasemi, Despoina Kepaptsoglou, Quentin Ramasse, Shinya Yamada, Kohei Hamaya, Thomas P A Hase, Vlado Lazarov, Gavin R. Bell

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The depth-resolved chemical structure and magnetic moment of Co2FeAl0.5Si0.5 thin films grown on Si(111) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45 Å of the surface and in a 25 Å substrate interface region. The reduced moment is related to with compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films.

Original language	English
Number of pages	8
Journal	Journal of Physics: Condensed Matter
Early online date	3 Jan 2018
DOIs	https://doi.org/10.1088/1361-648X/aaa4c8
Publication status	E-pub ahead of print - 3 Jan 2018

Bibliographical note

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10.1088/1361-648X/aaa4c8

Magnetic and structural depth profiles of Heusler alloy Co2 FeAl0.5Si0.5 epitaxial films on Si(111)
© 2018 IOP Publishing Ltd.
Accepted author manuscript, 0.99 MBLicence: Unspecified

Cite this

Glover, S. E., Saerbeck, T., Kuerbanjiang, B., Ghasemi, A., Kepaptsoglou, D., Ramasse, Q., Yamada, S., Hamaya, K., Hase, T. P. A., Lazarov, V., & Bell, G. R. (2018). Magnetic and structural depth profiles of Heusler alloy Co₂FeAl_0.5Si_0.5 epitaxial films on Si(111). Journal of Physics: Condensed Matter. Advance online publication. https://doi.org/10.1088/1361-648X/aaa4c8

@article{678514db2d62416e96243be214af4e79,

title = "Magnetic and structural depth profiles of Heusler alloy Co2FeAl0.5Si0.5 epitaxial films on Si(111)",

abstract = "The depth-resolved chemical structure and magnetic moment of Co2FeAl0.5Si0.5 thin films grown on Si(111) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45 {\AA} of the surface and in a 25 {\AA} substrate interface region. The reduced moment is related to with compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films.",

author = "Glover, {Stephanie Elizabeth} and Thomas Saerbeck and Balati Kuerbanjiang and Arsham Ghasemi and Despoina Kepaptsoglou and Quentin Ramasse and Shinya Yamada and Kohei Hamaya and Hase, {Thomas P A} and Vlado Lazarov and Bell, {Gavin R.}",

note = "{\textcopyright} 2018 IOP Publishing Ltd.",

year = "2018",

month = jan,

day = "3",

doi = "10.1088/1361-648X/aaa4c8",

language = "English",

journal = "Journal of Physics: Condensed Matter",

issn = "0953-8984",

publisher = "IOP Publishing",

}

TY - JOUR

T1 - Magnetic and structural depth profiles of Heusler alloy Co2FeAl0.5Si0.5 epitaxial films on Si(111)

AU - Glover, Stephanie Elizabeth

AU - Saerbeck, Thomas

AU - Kuerbanjiang, Balati

AU - Ghasemi, Arsham

AU - Kepaptsoglou, Despoina

AU - Ramasse, Quentin

AU - Yamada, Shinya

AU - Hamaya, Kohei

AU - Hase, Thomas P A

AU - Lazarov, Vlado

AU - Bell, Gavin R.

PY - 2018/1/3

Y1 - 2018/1/3

N2 - The depth-resolved chemical structure and magnetic moment of Co2FeAl0.5Si0.5 thin films grown on Si(111) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45 Å of the surface and in a 25 Å substrate interface region. The reduced moment is related to with compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films.

AB - The depth-resolved chemical structure and magnetic moment of Co2FeAl0.5Si0.5 thin films grown on Si(111) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45 Å of the surface and in a 25 Å substrate interface region. The reduced moment is related to with compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films.

U2 - 10.1088/1361-648X/aaa4c8

DO - 10.1088/1361-648X/aaa4c8

M3 - Article

C2 - 29297471

SN - 0953-8984

JO - Journal of Physics: Condensed Matter

JF - Journal of Physics: Condensed Matter

ER -