Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	ELECTRON MICROSCOPY 1998, VOL 1
Editors	HAC Benavides, MJ Yacaman
Place of Publication	BRISTOL
Publisher	IOP Publishing
Pages	495-496
Number of pages	2
ISBN (Print)	0-7503-0564-9
Publication status	Published - 1998
Event	14th International Congress on Electron Microscopy - CANCUN Duration: 31 Aug 1998 → 4 Sept 1998

Conference	14th International Congress on Electron Microscopy
City	CANCUN
Period	31/08/98 → 4/09/98

Cite this

@inproceedings{842adb164e994a70962e140102e97b3d,

title = "Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.",

author = "M Zadrazil and M El-Gomati",

year = "1998",

language = "English",

isbn = "0-7503-0564-9",

pages = "495--496",

editor = "HAC Benavides and MJ Yacaman",

booktitle = "ELECTRON MICROSCOPY 1998, VOL 1",

publisher = "IOP Publishing",

address = "United Kingdom",

note = "14th International Congress on Electron Microscopy ; Conference date: 31-08-1998 Through 04-09-1998",

}

TY - GEN

T1 - Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.

AU - Zadrazil, M

AU - El-Gomati, M

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 0-7503-0564-9

SP - 495

EP - 496

BT - ELECTRON MICROSCOPY 1998, VOL 1

A2 - Benavides, HAC

A2 - Yacaman, MJ

PB - IOP Publishing

CY - BRISTOL

T2 - 14th International Congress on Electron Microscopy

Y2 - 31 August 1998 through 4 September 1998

ER -