Medium-energy ion scattering studies of two-dimensional rare-earth silicides

D J Spence; S P Tear; T C Q Noakes; P Bailey

Medium-energy ion scattering studies of two-dimensional rare-earth silicides

D J Spence, S P Tear, T C Q Noakes, P Bailey

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Medium-energy ion scattering (MEIS) has been used to I;determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(lll). In the case of the Si(111)1X1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1X1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1X1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination.

Original language	English
Pages (from-to)	5707-5713
Number of pages	7
Journal	Physical Review B
Volume	61
Issue number	8
Publication status	Published - 15 Feb 2000

Keywords

2-DIMENSIONAL ER SILICIDE
SCHOTTKY-BARRIER
SI(111)
SURFACES

Cite this

@article{0996c828fc9541a989222f3a109528c9,

title = "Medium-energy ion scattering studies of two-dimensional rare-earth silicides",

abstract = "Medium-energy ion scattering (MEIS) has been used to I;determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(lll). In the case of the Si(111)1X1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1X1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1X1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination.",

keywords = "2-DIMENSIONAL ER SILICIDE, SCHOTTKY-BARRIER, SI(111), SURFACES",

author = "Spence, {D J} and Tear, {S P} and Noakes, {T C Q} and P Bailey",

year = "2000",

month = feb,

day = "15",

language = "English",

volume = "61",

pages = "5707--5713",

journal = "Physical Review B",

issn = "1098-0121",

publisher = "American Physical Society",

number = "8",

}

TY - JOUR

T1 - Medium-energy ion scattering studies of two-dimensional rare-earth silicides

AU - Spence, D J

AU - Tear, S P

AU - Noakes, T C Q

AU - Bailey, P

PY - 2000/2/15

Y1 - 2000/2/15

N2 - Medium-energy ion scattering (MEIS) has been used to I;determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(lll). In the case of the Si(111)1X1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1X1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1X1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination.

AB - Medium-energy ion scattering (MEIS) has been used to I;determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(lll). In the case of the Si(111)1X1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1X1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1X1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination.

KW - 2-DIMENSIONAL ER SILICIDE

KW - SCHOTTKY-BARRIER

KW - SI(111)

KW - SURFACES

M3 - Article

SN - 1098-0121

VL - 61

SP - 5707

EP - 5713

JO - Physical Review B

JF - Physical Review B

IS - 8

ER -