MEIC: Re-thinking RTL debug automation using LLMs

Ke Xu; Jualin Sun; Yuchen Hu; Xinwei Fang; Weiwei Shan; Xi Wang; Zhe  Jiang

doi:10.1145/3676536.3676801

MEIC: Re-thinking RTL debug automation using LLMs

Ke Xu, Jualin Sun, Yuchen Hu, Xinwei Fang^*, Weiwei Shan, Xi Wang, Zhe Jiang

^*Corresponding author for this work

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	ICCAD '24
Subtitle of host publication	Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design
Publisher	ACM
Number of pages	9
ISBN (Print)	979-8-4007-1077-3
DOIs	https://doi.org/10.1145/3676536.3676801
Publication status	Published - 9 Apr 2025
Event	Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design - Newark Liberty International Airport Marriott, New York, United States Duration: 27 Oct 2024 → 31 Oct 2024 Conference number: 43

Conference

Conference	Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design
Abbreviated title	ICCAD '24
Country/Territory	United States
City	New York
Period	27/10/24 → 31/10/24

Bibliographical note

Access to Document

10.1145/3676536.3676801

Accepted manuscript
© 2024 Copyright is held by the owner/author(s). This is an author-produced version of the published paper. Uploaded in accordance with the University’s Research Publications and Open Access policy.
Accepted author manuscript, 1.66 MBLicence: CC BY

Cite this

@inproceedings{d45c61f954f14fc0b57f068ddb64e94d,

title = "MEIC: Re-thinking RTL debug automation using LLMs",

author = "Ke Xu and Jualin Sun and Yuchen Hu and Xinwei Fang and Weiwei Shan and Xi Wang and Zhe Jiang",

note = "{\textcopyright} 2024 Copyright is held by the owner/author(s). This is an author-produced version of the published paper. Uploaded in accordance with the University{\textquoteright}s Research Publications and Open Access policy. ; Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD '24 ; Conference date: 27-10-2024 Through 31-10-2024",

year = "2025",

month = apr,

day = "9",

doi = "10.1145/3676536.3676801",

language = "English",

isbn = "979-8-4007-1077-3",

booktitle = "ICCAD '24",

publisher = "ACM",

address = "United States",

}

Xu, K, Sun, J, Hu, Y, Fang, X, Shan, W, Wang, X & Jiang, Z 2025, MEIC: Re-thinking RTL debug automation using LLMs. in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design., 100, ACM, Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, New York, New York, United States, 27/10/24. https://doi.org/10.1145/3676536.3676801

TY - GEN

T1 - MEIC

T2 - Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design

AU - Xu, Ke

AU - Sun, Jualin

AU - Hu, Yuchen

AU - Fang, Xinwei

AU - Shan, Weiwei

AU - Wang, Xi

AU - Jiang, Zhe

N1 - Conference code: 43

PY - 2025/4/9

Y1 - 2025/4/9

U2 - 10.1145/3676536.3676801

DO - 10.1145/3676536.3676801

M3 - Conference contribution

SN - 979-8-4007-1077-3

BT - ICCAD '24

PB - ACM

Y2 - 27 October 2024 through 31 October 2024

ER -