Mitigating Potential-Induced Degradation (PID) using SiO2 ARC layer

Mahmoud Dhimish*, Yihua Hu, Nigel Schofield, Romênia G. Vieira

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO2 ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm2, compared with 4.5 mA/cm2 current density loss without using the SiO2 ARC layer.

Original languageEnglish
Article number5139
Number of pages12
Issue number19
Publication statusPublished - 2 Oct 2020

Bibliographical note

Publisher Copyright:
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (


  • ARC
  • Current density
  • Electroluminescence imaging
  • PID mitigation
  • Solar cells

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