Mitigating Potential-Induced Degradation (PID) using SiO2 ARC layer

Mahmoud Dhimish; Yihua Hu; Nigel Schofield; Romênia G. Vieira

doi:10.3390/EN13195139

Mitigating Potential-Induced Degradation (PID) using SiO₂ ARC layer

Mahmoud Dhimish^*, Yihua Hu, Nigel Schofield, Romênia G. Vieira

^*Corresponding author for this work

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO₂ ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 ^◦C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm², compared with 4.5 mA/cm² current density loss without using the SiO₂ ARC layer.

Original language	English
Article number	5139
Number of pages	12
Journal	Energies
Volume	13
Issue number	19
DOIs	https://doi.org/10.3390/EN13195139
Publication status	Published - 2 Oct 2020

Bibliographical note

Publisher Copyright:
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

Keywords

ARC
Current density
Electroluminescence imaging
PID mitigation
Solar cells

Access to Document

10.3390/EN13195139

Mitigating Potential-Induced Degradation (PID) Using SiO2 ARC Layer
© 2020 by the authors.
Final published version, 3.68 MBLicence: CC BY

Cite this

@article{946c0afbaa914a568ceed00dbeee900c,

title = "Mitigating Potential-Induced Degradation (PID) using SiO2 ARC layer",

abstract = "Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO2 ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 ◦C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm2, compared with 4.5 mA/cm2 current density loss without using the SiO2 ARC layer.",

keywords = "ARC, Current density, Electroluminescence imaging, PID mitigation, Solar cells",

author = "Mahmoud Dhimish and Yihua Hu and Nigel Schofield and Vieira, {Rom{\^e}nia G.}",

note = "Publisher Copyright: {\textcopyright} 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).",

year = "2020",

month = oct,

day = "2",

doi = "10.3390/EN13195139",

language = "English",

volume = "13",

journal = "Energies",

issn = "1996-1073",

publisher = "Multidisciplinary Digital Publishing Institute",

number = "19",

}

TY - JOUR

T1 - Mitigating Potential-Induced Degradation (PID) using SiO2 ARC layer

AU - Dhimish, Mahmoud

AU - Hu, Yihua

AU - Schofield, Nigel

AU - Vieira, Romênia G.

N1 - Publisher Copyright: © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

PY - 2020/10/2

Y1 - 2020/10/2

N2 - Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO2 ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 ◦C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm2, compared with 4.5 mA/cm2 current density loss without using the SiO2 ARC layer.

AB - Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO2 ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 ◦C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm2, compared with 4.5 mA/cm2 current density loss without using the SiO2 ARC layer.

KW - ARC

KW - Current density

KW - Electroluminescence imaging

KW - PID mitigation

KW - Solar cells

UR - http://www.scopus.com/inward/record.url?scp=85096789086&partnerID=8YFLogxK

U2 - 10.3390/EN13195139

DO - 10.3390/EN13195139

M3 - Article

AN - SCOPUS:85096789086

SN - 1996-1073

VL - 13

JO - Energies

JF - Energies

IS - 19

M1 - 5139

ER -