Models of oxygen vacancy defects involved in degradation of gate dielectrics

A.L. Shluger
, K.P. McKenna

Physics

Research output: Chapter in Book/Report/Conference proceeding › Chapter

1 results

Finished

Non-equilibrium electron-ion dynamics in thin metal-oxide
McKenna, K. (Principal investigator)
EPSRC
1/01/13 → 30/04/18
Project: Research project (funded) › Research