Monte Carlo modeling of the low-loss electron signal in scanning electron microscopy and comparison with the BSE signal

C. Bonet*, A. Pratt, M. El-Gomati, J. A D Matthew, S. P. Tear

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)946-947
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 1 Aug 2008

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