Optimising Variability Tolerant Standard Cell Libraries

Research output: Contribution to journalArticlepeer-review

Abstract

This paper describes an approach to optimise transistor dimensions within a standard cell library. The goal is to extract high-speed and low-power circuits which are more tolerant to the random fluctuations that will be prevalent in future technology nodes. Using statistically enhanced SPICE models based on 3D-atomistic simulations, a Genetic Algorithm optimises the device widths within a circuit using a multi-objective fitness function. The results show the impact of threshold voltage variation can be reduced by optimising transistor widths, and suggest a similar method could be extended to the optimisation of larger circuits.

Original languageEnglish
Pages (from-to)2273-2280
Number of pages8
Journal2009 IEEE CONGRESS ON EVOLUTIONARY COMPUTATION, VOLS 1-5
Publication statusPublished - 2009

Keywords

  • INTEGRATED-CIRCUITS

Cite this