Optimization of Wide Field Interferometric Arrays via Simulated Annealing of a Beam Efficiency Function

Simon James Freethy; V. F. Shevchenko; Roddy Vann

doi:10.1109/TAP.2012.2207936

Optimization of Wide Field Interferometric Arrays via Simulated Annealing of a Beam Efficiency Function

Simon James Freethy, V. F. Shevchenko, Roddy Vann

Physics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	5442-5446
Journal	Ieee transactions on antennas and propagation
Volume	60
Issue number	11
DOIs	https://doi.org/10.1109/TAP.2012.2207936
Publication status	Accepted/In press - 2012

Bibliographical note

accepted for publication

Access to Document

10.1109/TAP.2012.2207936

SAMI (Synthetic Aperture Microwave Imaging): Measuring tokamak plasma current using electron Bernstein wave emission
Vann, R.
EPSRC
10/11/09 → 9/11/11
Project: Research project (funded) › Research

Cite this

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title = "Optimization of Wide Field Interferometric Arrays via Simulated Annealing of a Beam Efficiency Function",

author = "Freethy, {Simon James} and Shevchenko, {V. F.} and Roddy Vann",

note = "accepted for publication",

year = "2012",

doi = "10.1109/TAP.2012.2207936",

language = "English",

volume = "60",

pages = "5442--5446 ",

journal = "Ieee transactions on antennas and propagation",

issn = "0018-926X",

publisher = "IEEE",

number = "11",

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TY - JOUR

T1 - Optimization of Wide Field Interferometric Arrays via Simulated Annealing of a Beam Efficiency Function

AU - Freethy, Simon James

AU - Shevchenko, V. F.

AU - Vann, Roddy

N1 - accepted for publication

PY - 2012

Y1 - 2012

U2 - 10.1109/TAP.2012.2207936

DO - 10.1109/TAP.2012.2207936

M3 - Article

SN - 0018-926X

VL - 60

SP - 5442

EP - 5446

JO - Ieee transactions on antennas and propagation

JF - Ieee transactions on antennas and propagation

IS - 11

ER -

Optimization of Wide Field Interferometric Arrays via Simulated Annealing of a Beam Efficiency Function

Bibliographical note

Access to Document

Projects

SAMI (Synthetic Aperture Microwave Imaging): Measuring tokamak plasma current using electron Bernstein wave emission

Cite this