Abstract
This work is focused on the dynamic alternating current equivalent electric circuit (AC-EEC) modeling of the polycrystalline silicon wafer-based photovoltaic cell and module under various operational and fault conditions. The models are drawn from the impedance changes observed using electrochemical impedance spectroscopy. Vital considerations for valid impedance data and appropriate parameter extraction were also discussed. In this work, cell-level tests were carried out at different voltage bias levels under illumination, dark, uniform partial shading, and cell-mismatch conditions. The cell characterization procedure was then used as a basis for developing the photovoltaic (PV) module level model. Normal illumination and partial shading tests were carried out at the module/panel level. The AC-EEC model for both the levels was obtained from the associated Nyquist and Bode plots. These models were then used to extract the internal cell/module parameters and the associated trends were observed. Results obtained demonstrates that the variations of the ac model give several parameters that show distinct variation such that they can be used for inline characterization and real-time condition monitoring of the photovoltaic cells/module under the different operational and fault conditions.
Original language | English |
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Pages (from-to) | 1690-1701 |
Number of pages | 12 |
Journal | IEEE Transactions on Industry Applications |
Volume | 56 |
Issue number | 2 |
Early online date | 10 Dec 2019 |
DOIs | |
Publication status | Published - 1 Mar 2020 |
Bibliographical note
© 2019 IEEEKeywords
- Equivalent circuit model
- impedance
- photovoltaic
- polycrystalline silicon
- spectroscopy