Plasma ionization in low-pressure radio-frequency discharges: Part II: Particle-in-cell simulation

A. Meige, D. O'Connell, T. Gans, R. W. Boswell

Research output: Contribution to journalArticlepeer-review

Abstract

Plasma ionization in the low-pressure operation regime (< 5 Pa) of RF capacitively coupled plasmas (CCPs) is governed by a complex interplay of-various mechanisms, such as field reversal, sheath expansion, and wave-particle interactions. In a previous paper, it was shown that experimental observations in a hydrogen CCP operated at 13.56 MHz are qualitatively well described in a 1-D symmetrical particle-in-cell (PIC) simulation. In this paper, a spherical asymmetrical PIC simulation that is closer to the conditions of the highly asymmetrical experimental device is used to simulate a low-pressure neon CCP operated at 2 MHz. The results show a similar behavior, with pronounced ionization through field reversal, sheath expansion, and wave-particle interactions, and can be exploited for more accurate quantitative comparisons with experimental observations.

Original languageEnglish
Pages (from-to)1384-1385
Number of pages2
JournalIEEE transactions on plasma science
Volume36
Issue number4
DOIs
Publication statusPublished - Aug 2008

Keywords

  • capacitively coupled plasma (CCP)
  • field reversal
  • heating
  • particle-in-cell (PIC) simulation
  • RF
  • wave particle interaction

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