Abstract
Thin film multilayer materials are very important for a variety of key technologies such as hard drive storage. However, their multilayered nature means it can be difficult to examine them after production and determining properties of individual layers is harder still. Here, methods of preparing multilayer samples for examination using scanning thermal microscopy are compared, showing that both a combination of mechanical and ion beam polishing, and ion beam milling to form a crater produce suitable surfaces for scanning thermal microscopy examination. However, the larger exposed surfaces of the ion beam milled crater are the most promising for distinguishing between the layers and comparison of their thermal transport properties.
Original language | English |
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Article number | 225702 |
Number of pages | 10 |
Journal | Nanotechnology |
Volume | 35 |
Issue number | 22 |
DOIs | |
Publication status | Published - 13 May 2024 |
Bibliographical note
Funding Information:With thanks to Seagate for the provision of the samples. We acknowledge the support of EPSRC Grant EP/R513386/1.
Publisher Copyright:
© 2024 The Author(s). Published by IOP Publishing Ltd.
Keywords
- HAMR
- magnetic recording materials
- multilayer materials
- scanning thermal microscopy
- SThM
- thermal transport
Datasets
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Multilayer thermal data
Thompson, S. M. (Creator), University of York, 15 Dec 2023
DOI: 10.15124/c3130def-4f6e-4055-89f7-f3eeb152a7b7
Dataset