Abstract
Spin transport phenomena underpin an extensive range of spintronic eects.
In particular spin transport across interfaces occurs in most device concepts;
but is so far poorly understood. As interface properties strongly impact spin
transport, one needs to characterize and correlate them to the fabrication
method. Here we investigate pure spin current transport across interfaces
and connect this with imaging of the interfaces. We study the detection
of pure spin currents via the inverse spin Hall eect in Pt and the related
spin current absorption by Pt in Py-Cu-Pt lateral spin valves. Depending
on the fabrication process to pattern the Cu bridge, we either determine a
large (inverse) spin Hall eect signal and low spin absorption by Pt or vice
versa. We explain these counter-intuitive results by the fabrication induced
varying quality of the Cu/Pt interfaces, which is directly revealed via a special
scanning electron microscopy technique for buried interface imaging.
In particular spin transport across interfaces occurs in most device concepts;
but is so far poorly understood. As interface properties strongly impact spin
transport, one needs to characterize and correlate them to the fabrication
method. Here we investigate pure spin current transport across interfaces
and connect this with imaging of the interfaces. We study the detection
of pure spin currents via the inverse spin Hall eect in Pt and the related
spin current absorption by Pt in Py-Cu-Pt lateral spin valves. Depending
on the fabrication process to pattern the Cu bridge, we either determine a
large (inverse) spin Hall eect signal and low spin absorption by Pt or vice
versa. We explain these counter-intuitive results by the fabrication induced
varying quality of the Cu/Pt interfaces, which is directly revealed via a special
scanning electron microscopy technique for buried interface imaging.
Original language | English |
---|---|
Article number | 023110 |
Number of pages | 11 |
Journal | Physical Review Research |
Volume | 3 |
Issue number | 2 |
DOIs | |
Publication status | Published - 10 May 2021 |