Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Abstract—This paper shows a novel method of measuring the
immunity of electronic devices inside reverberation chambers.
Rather than using mode stirring or mode tuning with a constant
power input into the chamber, we will present a method based
on variable power that protects the DUT against accidental
damage and also gives more information about the hardness of
the DUT than the traditional methods.
Original languageEnglish
Title of host publication 10th Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)
Place of PublicationYork, UK
Number of pages3
Publication statusAccepted/In press - 26 Sept 2011


  • system immunity
  • EMC
  • reverberation chamber

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