Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage

Tobias Aurand; John Frederick Dawson; Martin Paul Robinson; Andy Marvin

Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage

Tobias Aurand, John Frederick Dawson, Martin Paul Robinson, Andy Marvin

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Abstract—This paper shows a novel method of measuring the
immunity of electronic devices inside reverberation chambers.
Rather than using mode stirring or mode tuning with a constant
power input into the chamber, we will present a method based
on variable power that protects the DUT against accidental
damage and also gives more information about the hardness of
the DUT than the traditional methods.

Original language	English
Title of host publication	10th Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)
Place of Publication	York, UK
Pages	391-393
Number of pages	3
Publication status	Accepted/In press - 26 Sept 2011

Keywords

system immunity
EMC
reverberation chamber

Access to Document

Postprint
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Accepted author manuscript, 122 KBLicence: Other

http://www.emceurope.eu/

Cite this

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title = "Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage ",

abstract = "Abstract—This paper shows a novel method of measuring theimmunity of electronic devices inside reverberation chambers.Rather than using mode stirring or mode tuning with a constantpower input into the chamber, we will present a method basedon variable power that protects the DUT against accidentaldamage and also gives more information about the hardness ofthe DUT than the traditional methods.",

keywords = " system immunity, EMC, reverberation chamber",

author = "Tobias Aurand and Dawson, {John Frederick} and Robinson, {Martin Paul} and Andy Marvin",

year = "2011",

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language = "English",

pages = "391--393",

booktitle = "10th Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)",

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AU - Aurand, Tobias

AU - Dawson, John Frederick

AU - Robinson, Martin Paul

AU - Marvin, Andy

PY - 2011/9/26

Y1 - 2011/9/26

N2 - Abstract—This paper shows a novel method of measuring theimmunity of electronic devices inside reverberation chambers.Rather than using mode stirring or mode tuning with a constantpower input into the chamber, we will present a method basedon variable power that protects the DUT against accidentaldamage and also gives more information about the hardness ofthe DUT than the traditional methods.

AB - Abstract—This paper shows a novel method of measuring theimmunity of electronic devices inside reverberation chambers.Rather than using mode stirring or mode tuning with a constantpower input into the chamber, we will present a method basedon variable power that protects the DUT against accidentaldamage and also gives more information about the hardness ofthe DUT than the traditional methods.

KW - system immunity

KW - EMC

KW - reverberation chamber

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M3 - Conference contribution

SP - 391

EP - 393

BT - 10th Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)

CY - York, UK

ER -

Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage

Abstract

Keywords

Access to Document

Other files and links

Non-linear Electromagnetic interactions

Electromagnetic compatibility of electronic circuits and systems

Cite this

Reverberation Chamber Immunity Testing: A novel methodology to avoid accidental DUT damage

Abstract

Keywords

Access to Document

Other files and links

Projects

Non-linear Electromagnetic interactions

Electromagnetic compatibility of electronic circuits and systems

Cite this