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  1. 2019
  2. A review of methods and data to determine raw material criticality

    Hool, A., Schrijvers, D., Blengini, G. A., Chen, W-Q., Dewulf, J., Eggert, R., van Ellen, L., Gauss, R., Goddin, J., Habib, K., Hagelüken, C., Hirohata, A., Hofmann-Amtenbrink, M., Kosmol, J., Le Gleuher, M., Grohol, M., Ku, A., Lee, M-H., Liu, G., Nansai, K. & 7 others, Nuss, P., Peck, D., Reller, A., Sonnemann, G., Tercero, L., Thorenz, A. & Wäger, P., 9 Nov 2019

    Article in Resources, Conservation and Recycling

  3. Half-lives of Sr 73 and y 76 and the consequences for the proton dripline

    Sinclair, L., Wadsworth, R., Dobaczewski, J., Pastore, A., Lorusso, G., Suzuki, H., Ahn, D. S., Baba, H., Browne, F., Davies, P. J., Doornenbal, P., Estrade, A., Fang, Y., Fukuda, N., Henderson, J., Isobe, T., Jenkins, D. G., Kubono, S., Li, Z., Lubos, D. & 14 others, Nishimura, S., Nishizuka, I., Patel, Z., Rice, S., Sakurai, H., Shimizu, Y., Schury, P., Takeda, H., Söderström, P. A., Sumikama, T., Watanabe, H., Werner, V., Wu, J. & Xu, Z. Y., 16 Oct 2019

    Article in Physical Review C

  4. Non-destructive imaging for quality assurance of magnetoresistive random-access memory junctions

    Jackson, E. A., Wu, Y., Frost, W. J., Kim, J-Y., Samiepour, M., Elphick, K., Sun, M., Kubota, T., Takanashi, K., Ichinose, T., Mizukami, S. & Hirohata, A., 16 Oct 2019

    Article in Journal of Physics D: Applied Physics

  5. Ultra-thin transmissive crystalline silicon high-contrast grating metasurfaces

    Li, H., Stellinga, D. P., Qiu, Y., Sun, Q., Chen, B., Liang, H., Krauss, T. F. & Li, J., 14 Oct 2019

    Article in Optics Express

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