Secondary, backscattered and low energy loss electrons in the SEM: Quantification for nano analysis

M. M. El-Gomati; C. G H Walker; C. Bonet; S. P. Tear; J. A D Matthew

doi:10.1017/S1431927608086972

Secondary, backscattered and low energy loss electrons in the SEM: Quantification for nano analysis

M. M. El-Gomati, C. G H Walker, C. Bonet, S. P. Tear, J. A D Matthew

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	908-909
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608086972
Publication status	Published - 1 Aug 2008

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title = "Secondary, backscattered and low energy loss electrons in the SEM: Quantification for nano analysis",

author = "El-Gomati, {M. M.} and Walker, {C. G H} and C. Bonet and Tear, {S. P.} and Matthew, {J. A D}",

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AU - Bonet, C.

AU - Tear, S. P.

AU - Matthew, J. A D

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Secondary, backscattered and low energy loss electrons in the SEM: Quantification for nano analysis

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