Secondary, backscattered and low energy loss electrons in the SEM: Quantification for nano analysis

M. M. El-Gomati, C. G H Walker, C. Bonet, S. P. Tear, J. A D Matthew

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)908-909
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 1 Aug 2008

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