Self-assembly of ultrafine nanolines upon Ho reaction with the Ge(001) surface

C. Bonet, S. P. Tear

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Abstract

The reaction of the rare earth metal Ho with the Ge(001) surface at 440 degrees C has been studied by scanning tunneling microscopy (STM). The self-assembly of ultrafine nanolines growing along substrate < 110 > directions has been observed, and based on atomic resolution STM images, the authors propose a model of the nanolines and comment on their relationship to the very initial stages of growth of a hexagonal germanide structure. The authors further report the presence of nanoscale trenches associated with well-ordered lines of missing dimer defects and discuss the relationship of these to the nanolines. Their results have possible applications involving interconnects or templating in nanoscale devices, and additionally, may provide insight into the nucleation mechanism of coarser nanowires. (c) 2006 American Institute of Physics.

Original languageEnglish
Article number203119
Pages (from-to)-
Number of pages3
JournalApplied Physics Letters
Volume89
Issue number20
DOIs
Publication statusPublished - 13 Nov 2006

Keywords

  • RARE-EARTH SILICIDES
  • SCHOTTKY-BARRIER
  • DIMER-VACANCIES
  • GROWTH
  • NANOWIRES
  • SILICON
  • SI(001)
  • SI

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