Sensor based on the mode-localization effect in electrostatically-coupled MEMS resonators fabricated using an SOI process

Graham S. Wood, Chun Zhao, Ibrahim Sari, Suan Hui Pu, Michael Kraft

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The mode-localization effect exhibited in electrostatically-coupled microelectromechanical systems (MEMS) resonators was demonstrated using a pair of rectangular clamped-clamped beams that were fabricated using a silicon-on-insulator (SOI) based process. The response of the amplitude ratio of the resonating beams at the fundamental mode frequencies to a change in the stiffness of one of the beams was characterized. Beams with different widths were fabricated and tested, with up to 13 times improvement in sensitivity to relative stiffness change being reported for a device with 20 μιη widths, compared to 10 μιη widths. In addition, when compared to the state-of-the-art, the devices reported up to 2.8 times improvement in sensitivity.

Original languageEnglish
Title of host publication2015 IEEE SENSORS - Proceedings
PublisherIEEE
ISBN (Electronic)9781479982028
DOIs
Publication statusPublished - 7 Jan 2016
Event14th IEEE SENSORS - Busan, Korea, Republic of
Duration: 1 Nov 20154 Nov 2015

Publication series

Name2015 IEEE SENSORS - Proceedings

Conference

Conference14th IEEE SENSORS
Country/TerritoryKorea, Republic of
CityBusan
Period1/11/154/11/15

Keywords

  • MEMS
  • mode-localization
  • Resonators
  • sensor
  • stiffness change

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