Simulation of a Bessel box electron energy analyser for analysis of secondary electrons

Ashish Suri, Andrew Pratt, Mohamed M El Gomati, Steven Philip Tear, Christopher George Havelock Walker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThe 16th European Microscopy Congress 2016
Number of pages2
Publication statusPublished - 29 Aug 2016

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