Size effects in submicron exchange bias square elements

G. Vallejo-Fernandez, J. N. Chapman

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The behavior of submicron exchange bias square elements has been investigated for systems containing metallic polycrystalline layers. Numerical simulations using a simple theoretical model show that the exchange bias for such elements can increase and/or decrease depending on the microstructure of the antiferromagnetic layer and, in particular, its grain size distribution. The predictions are based on a granular model of exchange bias that accounts for grain cutting at the edges of the nanoelements that takes place during ion milling/etching. This leads to distributions of exchange bias fields that can be quite broad, especially in sub-250 nm elements.

Original languageEnglish
Article number262508
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Issue number26
Publication statusPublished - 29 Jun 2009

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