By the same authors

SPECULAR AND DIFFUSE REFLECTANCE IN MICROFACET MODELS

Research output: Contribution to conferencePaper

Author(s)

Department/unit(s)

Conference

Conference16th IEEE International Conference on Image Processing
CountryEgypt
CityCairo
Conference date(s)7/11/0910/11/09

Publication details

DatePublished - 2009
Original languageEnglish

Bibliographical note

16th IEEE International Conference on Image Processing, Cairo, EGYPT, NOV 07-10, 2009

Discover related content

Find related publications, people, projects, datasets and more using interactive charts.

View graph of relations