Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings

Xiao Bai, Edwin R. Hancock (Editor), Tin Kam Ho (Editor), Richard C. Wilson (Editor), Battista Biggio (Editor), Antonio Robles-Kelly

Research output: Book/ReportAnthology

Original languageEnglish
PublisherSpringer
Number of pages540
Volume11004
ISBN (Print)978-3-319-97784-3
DOIs
Publication statusPublished - 2018

Publication series

NameLecture Notes in Computer Science
PublisherSpringer

Cite this