Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number45001
Number of pages7
JournalPHYSICAL REVIEW MATERIALS
Volume2
Issue number4
DOIs
Publication statusPublished - 6 Apr 2018

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© 2018, The Author(s).

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