Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM - Research Database, The University of York

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Structure and properties of a model conductive filament/host oxide interface in HfO₂-based ReRAM

Research output: Contribution to journal › Article › peer-review

Full text download(s)

PhysRevMaterials.2.045001
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Published copy (DOI)

10.1103/PhysRevMaterials.2.045001

Author(s)

Department/unit(s)

Physics

Publication details

Journal	PHYSICAL REVIEW MATERIALS
Date	Accepted/In press - 23 Mar 2018
Date	Published (current) - 6 Apr 2018
Issue number	4
Volume	2
Number of pages	7
Original language	English

Bibliographical note

© 2018, The Author(s).

Projects

High-throughput screening of polycrystalline solar absorbers (Ext.)
Project: Research project (funded) › Research
Non-equilibrium electron-ion dynamics in thin metal-oxide
Project: Research project (funded) › Research

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