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Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM

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JournalPHYSICAL REVIEW MATERIALS
DateAccepted/In press - 23 Mar 2018
DatePublished (current) - 6 Apr 2018
Issue number4
Volume2
Number of pages7
Original languageEnglish

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© 2018, The Author(s).

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