The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface

Balati Kuerbanjiang; Zlatko Nedelkoski; Demie Kepaptsoglou; Arsham Ghasemi; Stephanie Glover; Shinya Yamada; Thomas Saerbeck; Quentin Ramasse; Philip James Hasnip; T P A Hase; Gavin R. Bell; Kohei Hamaya; Atsufumi Hirohata; Vlado Lazarov

doi:10.1063/1.4948466

The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface

Balati Kuerbanjiang, Zlatko Nedelkoski, Demie Kepaptsoglou, Arsham Ghasemi, Stephanie Glover, Shinya Yamada, Thomas Saerbeck, Quentin Ramasse, Philip James Hasnip, T P A Hase, Gavin R. Bell, Kohei Hamaya, Atsufumi Hirohata, Vlado Lazarov

Research output: Contribution to journal › Article › peer-review

Abstract

We show that Co2FeAl0.5Si0.5 film deposited on Si(111) has a single crystal structure and twin related epitaxial relationship with the substrate. Sub-nanometer electron energy loss spectroscopy shows that in a narrow interface region there is a mutual inter-diffusion dominated by Si and Co. Atomic resolution aberration-corrected scanning transmission electron microscopy reveals that the film has B2 ordering. The film lattice structure is unaltered even at the interface due to the substitu- tional nature of the intermixing. First-principles calculations performed using structural models based on the aberration corrected electron microscopy show that the increased Si incorporation in the film leads to a gradual decrease of the magnetic moment as well as significant spin-polarization reduction. These effects can have significant detrimental role on the spin injection from the Co2FeAl0.5Si0.5 film into the Si substrate, besides the structural integrity of this junction.

Original language	English
Article number	172412
Number of pages	5
Journal	Applied Physics Letters
Volume	108
DOIs	https://doi.org/10.1063/1.4948466
Publication status	Published - 29 Apr 2016

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10.1063/1.4948466

1.4948466
© 2016, The author(s)
Final published version, 1.03 MBLicence: CC BY

Half-metallic Ferromagnets: materials fundamentals for next-generation spintronics
Lazarov, V., Hirohata, A. & McKenna, K. P.
EPSRC
1/10/13 → 31/01/18
Project: Research project (funded) › Research
RPF 13/14 High-energy-resolution spectroscopy of functional nanomaterials
McKenna, K. P., Lazarov, V., Clark, J. H. & Pratt, A.
1/08/13 → 31/07/14
Project: Other project › Other internal award

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Kuerbanjiang, B., Nedelkoski, Z., Kepaptsoglou, D., Ghasemi, A., Glover, S., Yamada, S., Saerbeck, T., Ramasse, Q., Hasnip, P. J., Hase, T. P. A., Bell, G. R., Hamaya, K., Hirohata, A., & Lazarov, V. (2016). The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface. Applied Physics Letters, 108, Article 172412. https://doi.org/10.1063/1.4948466

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title = "The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface",

abstract = "We show that Co2FeAl0.5Si0.5 film deposited on Si(111) has a single crystal structure and twin related epitaxial relationship with the substrate. Sub-nanometer electron energy loss spectroscopy shows that in a narrow interface region there is a mutual inter-diffusion dominated by Si and Co. Atomic resolution aberration-corrected scanning transmission electron microscopy reveals that the film has B2 ordering. The film lattice structure is unaltered even at the interface due to the substitu- tional nature of the intermixing. First-principles calculations performed using structural models based on the aberration corrected electron microscopy show that the increased Si incorporation in the film leads to a gradual decrease of the magnetic moment as well as significant spin-polarization reduction. These effects can have significant detrimental role on the spin injection from the Co2FeAl0.5Si0.5 film into the Si substrate, besides the structural integrity of this junction.",

author = "Balati Kuerbanjiang and Zlatko Nedelkoski and Demie Kepaptsoglou and Arsham Ghasemi and Stephanie Glover and Shinya Yamada and Thomas Saerbeck and Quentin Ramasse and Hasnip, {Philip James} and Hase, {T P A} and Bell, {Gavin R.} and Kohei Hamaya and Atsufumi Hirohata and Vlado Lazarov",

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doi = "10.1063/1.4948466",

language = "English",

volume = "108",

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Kuerbanjiang, B, Nedelkoski, Z, Kepaptsoglou, D, Ghasemi, A, Glover, S, Yamada, S, Saerbeck, T, Ramasse, Q, Hasnip, PJ, Hase, TPA, Bell, GR, Hamaya, K, Hirohata, A & Lazarov, V 2016, 'The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface', Applied Physics Letters, vol. 108, 172412. https://doi.org/10.1063/1.4948466

TY - JOUR

T1 - The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface

AU - Kuerbanjiang, Balati

AU - Nedelkoski, Zlatko

AU - Kepaptsoglou, Demie

AU - Ghasemi, Arsham

AU - Glover, Stephanie

AU - Yamada, Shinya

AU - Saerbeck, Thomas

AU - Ramasse, Quentin

AU - Hasnip, Philip James

AU - Hase, T P A

AU - Bell, Gavin R.

AU - Hamaya, Kohei

AU - Hirohata, Atsufumi

AU - Lazarov, Vlado

PY - 2016/4/29

Y1 - 2016/4/29

N2 - We show that Co2FeAl0.5Si0.5 film deposited on Si(111) has a single crystal structure and twin related epitaxial relationship with the substrate. Sub-nanometer electron energy loss spectroscopy shows that in a narrow interface region there is a mutual inter-diffusion dominated by Si and Co. Atomic resolution aberration-corrected scanning transmission electron microscopy reveals that the film has B2 ordering. The film lattice structure is unaltered even at the interface due to the substitu- tional nature of the intermixing. First-principles calculations performed using structural models based on the aberration corrected electron microscopy show that the increased Si incorporation in the film leads to a gradual decrease of the magnetic moment as well as significant spin-polarization reduction. These effects can have significant detrimental role on the spin injection from the Co2FeAl0.5Si0.5 film into the Si substrate, besides the structural integrity of this junction.

AB - We show that Co2FeAl0.5Si0.5 film deposited on Si(111) has a single crystal structure and twin related epitaxial relationship with the substrate. Sub-nanometer electron energy loss spectroscopy shows that in a narrow interface region there is a mutual inter-diffusion dominated by Si and Co. Atomic resolution aberration-corrected scanning transmission electron microscopy reveals that the film has B2 ordering. The film lattice structure is unaltered even at the interface due to the substitu- tional nature of the intermixing. First-principles calculations performed using structural models based on the aberration corrected electron microscopy show that the increased Si incorporation in the film leads to a gradual decrease of the magnetic moment as well as significant spin-polarization reduction. These effects can have significant detrimental role on the spin injection from the Co2FeAl0.5Si0.5 film into the Si substrate, besides the structural integrity of this junction.

U2 - 10.1063/1.4948466

DO - 10.1063/1.4948466

M3 - Article

SN - 0003-6951

VL - 108

JO - Applied Physics Letters

JF - Applied Physics Letters

M1 - 172412

ER -

The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface

Abstract

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Projects

Half-metallic Ferromagnets: materials fundamentals for next-generation spintronics

RPF 13/14 High-energy-resolution spectroscopy of functional nanomaterials

Cite this