The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison

C. G. H. Walker; M. M. El-Gomati; A. M. D. Assa'd; M. Zadrazil

doi:10.1002/sca.20124

The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison

C. G. H. Walker, M. M. El-Gomati, A. M. D. Assa'd, M. Zadrazil

Electronic Engineering

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Abstract

The secondary electron (SE) yield, 6, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of (5 but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30: 365-380, 2008. (C) 2008 Wiley Periodicals, Inc.

Original language	English
Pages (from-to)	365-380
Number of pages	16
Journal	Scanning
Volume	30
Issue number	5
DOIs	https://doi.org/10.1002/sca.20124
Publication status	Published - Sep 2008

Keywords

Monte Carlo
secondary electron yield
low energy
inelastic mean free path
d band
MEAN-FREE-PATH
MONTE-CARLO
ENERGY
METALS
MICROSCOPY
SEMICONDUCTORS
REFLECTION
DEPENDENCE
SCATTERING
SYSTEM

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10.1002/sca.20124

http://onlinelibrary.wiley.com/doi/10.1002/sca.20124/abstract

Cite this

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The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison

Abstract

Keywords

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