Abstract
The secondary electron (SE) yield, 6, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of (5 but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30: 365-380, 2008. (C) 2008 Wiley Periodicals, Inc.
Original language | English |
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Pages (from-to) | 365-380 |
Number of pages | 16 |
Journal | Scanning |
Volume | 30 |
Issue number | 5 |
DOIs | |
Publication status | Published - Sept 2008 |
Keywords
- Monte Carlo
- secondary electron yield
- low energy
- inelastic mean free path
- d band
- MEAN-FREE-PATH
- MONTE-CARLO
- ENERGY
- METALS
- MICROSCOPY
- SEMICONDUCTORS
- REFLECTION
- DEPENDENCE
- SCATTERING
- SYSTEM