The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison

C. G. H. Walker, M. M. El-Gomati, A. M. D. Assa'd, M. Zadrazil

Research output: Contribution to journalArticlepeer-review

Abstract

The secondary electron (SE) yield, 6, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of (5 but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30: 365-380, 2008. (C) 2008 Wiley Periodicals, Inc.

Original languageEnglish
Pages (from-to)365-380
Number of pages16
JournalScanning
Volume30
Issue number5
DOIs
Publication statusPublished - Sept 2008

Keywords

  • Monte Carlo
  • secondary electron yield
  • low energy
  • inelastic mean free path
  • d band
  • MEAN-FREE-PATH
  • MONTE-CARLO
  • ENERGY
  • METALS
  • MICROSCOPY
  • SEMICONDUCTORS
  • REFLECTION
  • DEPENDENCE
  • SCATTERING
  • SYSTEM

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