Uncalibrated two-view metrology

B J Liang, Z Z Chen, N Pears

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method of visual metrology from uncalibrated cameras is proposed in this paper whereby a camera, which captures two images separated by a (near) pure translation, becomes a height measurement device. A novel projective construction allows accurate affine height measurements to be made relative to a reference plane, given that the reference plane planar homography between the two views can be accurately recovered. To this end a planar homography estimation method is presented, which is highly accurate and robust and based on a novel reciprocal-polar (RP) image rectification. The absolute height of any pixel or feature above the reference plane can be obtained from this affine height once the camera's distance to the reference plane, or the height of a second measurement in the image is specified. Results from our data show a mean absolute error of 6.9mm and with two outliers removed this falls to 1.5mm.

Original languageEnglish
Title of host publicationPROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 1
EditorsJ Kittler, M Petrou, M Nixon
Place of PublicationLOS ALAMITOS
PublisherIEEE Computer Society
Pages96-99
Number of pages4
ISBN (Print)0-7695-2128-2
Publication statusPublished - 2004
Event17th International Conference on Pattern Recognition (ICPR) - Cambridge
Duration: 23 Aug 200426 Aug 2004

Conference

Conference17th International Conference on Pattern Recognition (ICPR)
CityCambridge
Period23/08/0426/08/04

Keywords

  • FACTORIZATION METHOD
  • MOTION

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