Abstract
We present a structural and density functional theory study of FexCu1-xSe within the three-dimensional topological insulator Bi2Te3. The FexCu1-xSe inclusions are single-crystalline and epitaxially oriented with respect to the Bi2Te3 thin film. Aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy show an atomically sharp FeICu1-xSe/Bi2Te3 interface. The FexCu1-xSe/Bi2Te3 interface is determined by Se-Te bonds and no misfit dislocations are observed, despite the different lattice symmetries and large lattice mismatch of [sim]19%. First-principle calculations show that the large strain at the FexCu1-xSe/Bi2Te3 interface can be accommodated by van der Waals-like bonding between Se and Te atoms.
Original language | English |
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Article number | e402 |
Number of pages | 5 |
Journal | NPG Asia Materials |
Volume | 9 |
Issue number | e402 |
Early online date | 1 Jul 2017 |
DOIs | |
Publication status | Published - 7 Jul 2017 |
Bibliographical note
© The Author(s), 2017.Datasets
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Van der Waals epitaxy between the highly lattice mismatched Cu doped FeSe and Bi2Te3 topological insulator
Lazarov, V. (Creator), University of York, 23 May 2017
DOI: 10.15124/5804ac81-b49b-46ce-aea8-73d47a9192cb
Dataset