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Well-distributed SIFT features

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JournalElectronics Letters
DatePublished - 12 Mar 2009
Issue number6
Volume45
Number of pages2
Pages (from-to)308-310
Original languageEnglish

Abstract

A method to enhance the recognition of spatially distributed features, based on the scale invariant feature transform (SIFT), is reported. The key idea is to modify the way in which the selection of a set of contender interest points from each input image is carried out, using a non-maximal suppression approach in the different scale spaces.

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