By the same authors

From the same journal

Well-distributed SIFT features

Research output: Contribution to journalArticlepeer-review

Published copy (DOI)



Publication details

JournalElectronics Letters
DatePublished - 12 Mar 2009
Issue number6
Number of pages2
Pages (from-to)308-310
Original languageEnglish


A method to enhance the recognition of spatially distributed features, based on the scale invariant feature transform (SIFT), is reported. The key idea is to modify the way in which the selection of a set of contender interest points from each input image is carried out, using a non-maximal suppression approach in the different scale spaces.

Discover related content

Find related publications, people, projects, datasets and more using interactive charts.

View graph of relations