X-Ray Lasers as Probes of Plasma Parameters

G. J. Tallents; N. Booth; M. H. Edwards; L. M. R. Gartside; H. Huang; A. K. Rossall; E. Wagenaars; D. S. Whittaker; Z. Zhai

doi:10.1007/978-1-4020-9924-3_38

X-Ray Lasers as Probes of Plasma Parameters

G. J. Tallents, N. Booth, M. H. Edwards, L. M. R. Gartside, H. Huang, A. K. Rossall, E. Wagenaars, D. S. Whittaker, Z. Zhai

Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

General issues relevant to the probing of plasmas with backlighters are first discussed. It is shown that soft x-ray wavelengths (> 10 nm) can generally probe thicker plasmas than harder radiation (< 1 nm) if the plasma is hot (> 100 eV). Demonstration experiments are discussed where the transmission of x-ray lasers through other laser-heated solid targets have been used (i) to measure the rate of laser ablation of solid targets and (ii) to probe the opacity of a plasma material. It is shown that narrow bandwidth radiation, such as from an x-ray laser, offers the ability to probe much more optically thick plasmas than backlighters composed of moderate to wide bandwidth spectral lines.

Original language	English
Pages (from-to)	331-340
Number of pages	10
Journal	Springer Proceedings in Physics
Volume	130
DOIs	https://doi.org/10.1007/978-1-4020-9924-3_38
Publication status	Published - 2009

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Cite this

@article{c7e1c47ef4ac415dbdd36ebf8091c551,

title = "X-Ray Lasers as Probes of Plasma Parameters",

abstract = "General issues relevant to the probing of plasmas with backlighters are first discussed. It is shown that soft x-ray wavelengths (> 10 nm) can generally probe thicker plasmas than harder radiation (< 1 nm) if the plasma is hot (> 100 eV). Demonstration experiments are discussed where the transmission of x-ray lasers through other laser-heated solid targets have been used (i) to measure the rate of laser ablation of solid targets and (ii) to probe the opacity of a plasma material. It is shown that narrow bandwidth radiation, such as from an x-ray laser, offers the ability to probe much more optically thick plasmas than backlighters composed of moderate to wide bandwidth spectral lines.",

author = "Tallents, {G. J.} and N. Booth and Edwards, {M. H.} and Gartside, {L. M. R.} and H. Huang and Rossall, {A. K.} and E. Wagenaars and Whittaker, {D. S.} and Z. Zhai",

year = "2009",

doi = "10.1007/978-1-4020-9924-3_38",

language = "English",

volume = "130",

pages = "331--340",

journal = "Springer Proceedings in Physics",

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publisher = "Springer Science and Business Media Deutschland GmbH",

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TY - JOUR

T1 - X-Ray Lasers as Probes of Plasma Parameters

AU - Tallents, G. J.

AU - Booth, N.

AU - Edwards, M. H.

AU - Gartside, L. M. R.

AU - Huang, H.

AU - Rossall, A. K.

AU - Wagenaars, E.

AU - Whittaker, D. S.

AU - Zhai, Z.

PY - 2009

Y1 - 2009

N2 - General issues relevant to the probing of plasmas with backlighters are first discussed. It is shown that soft x-ray wavelengths (> 10 nm) can generally probe thicker plasmas than harder radiation (< 1 nm) if the plasma is hot (> 100 eV). Demonstration experiments are discussed where the transmission of x-ray lasers through other laser-heated solid targets have been used (i) to measure the rate of laser ablation of solid targets and (ii) to probe the opacity of a plasma material. It is shown that narrow bandwidth radiation, such as from an x-ray laser, offers the ability to probe much more optically thick plasmas than backlighters composed of moderate to wide bandwidth spectral lines.

AB - General issues relevant to the probing of plasmas with backlighters are first discussed. It is shown that soft x-ray wavelengths (> 10 nm) can generally probe thicker plasmas than harder radiation (< 1 nm) if the plasma is hot (> 100 eV). Demonstration experiments are discussed where the transmission of x-ray lasers through other laser-heated solid targets have been used (i) to measure the rate of laser ablation of solid targets and (ii) to probe the opacity of a plasma material. It is shown that narrow bandwidth radiation, such as from an x-ray laser, offers the ability to probe much more optically thick plasmas than backlighters composed of moderate to wide bandwidth spectral lines.

U2 - 10.1007/978-1-4020-9924-3_38

DO - 10.1007/978-1-4020-9924-3_38

M3 - Conference article

SN - 0930-8989

VL - 130

SP - 331

EP - 340

JO - Springer Proceedings in Physics

JF - Springer Proceedings in Physics

ER -